Microscopy & Microanalysis Tool Set  

V-2013090302
Calculates Inelastic Electron Mean Free Path for use in EELS (λ)

Parameter
Value
 units 
Mean Atomic Number (Z)
Accelerating Voltage (Vo) kV
Collection Half Angle (β) mR
Measured t/λ
Calculated thickness (t) nm
Calculated Meanfree Path (λ) nm
Ref: Egerton & Chang, Ultramicroscopy 21 (1987) 231-244


This Tool is written in JavaScript and should be platform Independent.
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  EMail:  

Zaluzec@aaem.amc.anl.gov
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Zaluzec@Microscopy.Com